Ключевые слова: presentation, HTS, REBCO, coated conductors, doping, fabrication, IBAD process, PLD process, high rate process, doping, coils pancake, current-voltage characteristics, uniformity, Jc/B curves, angular dependence, critical current, magnetic field dependence, mechanical properties, thickness dependence, fatigue behavior, stress effects, strain effects
Ключевые слова: presentation, HTS, REBCO, coated conductors, fabrication, IBAD process, PLD process, status, critical caracteristics, critical current, magnetic field dependence, angular dependence, mechanical properties, tensile tests, strain effects, stress effects, bending process, compression, delamination, magnets sextupole, conduction cooled systems, coils pancake, test results
Yoshida Y., Iijima Y., Furuse M., Kakimoto K., Fujita S., Yoshida T., Daibo M., Ohsugi M., Hirata W.
Iijima Y., Awaji S., Kiss T., Kakimoto K., Fujita S., Yoshida T., Daibo M., Okada T., Muto S., Hirata W.
Ключевые слова: HTS, EuBCO, coated conductor modules, fabrication, PLD process, IBAD process, pinning, doping effect, pinning centers artificial, growth rate, critical caracteristics, critical current distribution, microstructure, Jc/B curves, pinning force, critical current density, angular dependence, critical current, magnetic field dependence, experimental results
Iijima Y., Awaji S., Kiss T., Kakimoto K., Fujita S., Igarashi M., Adachi Y., Naoe K., Yoshida T., Okada T., Muto S., Hirata W.
Ключевые слова: HTS, EuBCO, coated conductors, long conductors, PLD process, IBAD process, doping effect, pinning centers artificial, fabrication, critical caracteristics, critical current, angular dependence, thickness dependence, temperature dependence, pinning force, magnetic field dependence, microstructure, homogeneity, experimental results, length
Iijima Y., Higashikawa K., Awaji S., Kiss T., Kakimoto K., Fujita S., Igarashi M., Fukuzaki T., Adachi Y., Naoe K., Yoshida T., Daibo M., Muto S., Hirata W.
Ключевые слова: HTS, GdBCO, EuBCO, coated conductors, fabrication, doping effect, PLD process, IBAD process, uniformity, homogeneity, substrate Hastelloy, critical caracteristics, critical current density, pinning force, magnetic field dependence, Jc/B curves, critical current, angular dependence, microstructure, temperature dependence, experimental results
Iijima Y., Kakimoto K., Fujita S., Itoh M., Igarashi M., Hanyu S., Adachi Y., Nakamura N., Kikutake R., Daibo M., Nagata M., Ohsugi M., Tateno F.
Iijima Y., Fuji H., Kakimoto K., Sutoh Y., Fujita S., Itoh M., Igarashi M., Hanyu S., Tobita H., Nakamura N., Kikutake R., Daibo M., Nagata M.
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Sutoh Y., Itoh M., Igarashi M., Hanyu S., Kutami H., Kikutake R., Daibo M., Suzuki R.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Nakamura N., Takemoto T., Kikutake R.
Iijima Y., Higashikawa K., Kiss T., Saitoh T., Izumi T., Inoue M., Imamura K., Kakimoto K., Shiohara K., Kawaguchi T.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C., Morita K.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C., Morita K.
Ключевые слова: HTS, coated conductors, long conductors, high rate process, REBCO, IBAD process, PLD process, substrate Ni alloy, fabrication, texture, critical current distribution, length
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Fujita S., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C., Morita K., Nakamura N.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C., Morita K., Nakamura N.
Ключевые слова: HTS, REBCO, coated conductors, IBAD process, buffer layers, texture, microstructure, fabrication, length
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Fujita S., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Morita K., Nakamura N.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C., Morita K.
Ключевые слова: HTS, REBCO, IBAD process, high rate process, fabrication, long conductors, texture, critical caracteristics, critical current, length
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C.
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C.
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C.
Ключевые слова: HTS, REBCO, coated conductors, IBAD process, fabrication, buffer layers, high rate process, microstructure
Ключевые слова: HTS, coated conductors, YBCO, Hall sensor, magnetic field distribution, current distribution, current density, experimental results
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C.
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, PLD process, assembled conductors, ac losses, ac losses, ac losses, experimental results, geometry effects, fabrication
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Kato T., Hirayama T., Igarashi M., Hanyu S., Hanada Y., Miura T.
Ключевые слова: HTS, REBCO, coated conductors, IBAD process, PLD process, long conductors, template layers, fabrication, critical current density, critical caracteristics, length
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Kato T., Hirayama T., Igarashi M., Hanyu S., Hanada Y., Miura T.
Ключевые слова: HTS, REBCO, coated conductors, buffer layers, IBAD process, texture, microstructure, fabrication
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, buffer layers, substrate Ni, IBAD process, long conductors, texture, growth rate, fabrication, length
Iijima Y., Muroga T., Saitoh T., Izumi T., Shiohara Y., Watanabe T., Kakimoto K., Yamada Y., Iwai H., Hirayama T., Sutoh Y., Miyata S., Sasaki H., Kato T.(tkato@jfcc.or.jp), Ikuhara Y., Ibi A., Sasaki Y.
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, PLD process, fabrication, microstructure, grain alignment
Kakimoto K., Sutoh Y., Ajimura S., Saitoh T.(tsaitoh@fujikura.co.jp), Kaneko N., Hanyu S., Iijima Y.(iijimay@fujikura.co.jp)
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, PLD process, long conductors, fabrication, length
Iijima Y., Kakimoto K., Sutoh Y., Saitoh T.(tsaitoh@fujikura.co.jp), Hanyu S., Kaneko N.(nkaneko@fujikura.co.jp)
Ключевые слова: HTS, YBCO, IBAD process, template layers, substrate Ni alloy, nanoscaled roughness, grain alignment, fabrication, coated conductors
Iijima Y., Awaji S., Watanabe K., Takeo M., Kiss T., Saitoh T., Tokunaga Y., Izumi T., Shiohara Y., Inoue M., Kakimoto K., Matsuda J., Sawa H., Tsuda Y.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Ajimura S.(sajimura@fujikura.co.jp)
Ключевые слова: HTS, coated conductors, buffer layers, IBAD process, YBCO, PLD process, reel-to-reel process, long conductors, coils, critical current, thickness dependence, critical current distribution, homogeneity, current-voltage characteristics, upper critical fields, critical caracteristics, fabrication, power equipment, substrate Hastelloy, magnetic properties
Iijima Y., Kakimoto K.(kakimoto@rd.fujikura.co.jp), Saitoh T., Sutoh Y., Kaneko N.
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, template layers, substrate Hastelloy, PLD process, coils solenoidal, reel-to-reel process, long conductors, current-voltage characteristics, critical current density, thickness dependence, tensile tests, bending process, experimental results, fabrication, power equipment, critical caracteristics, quality control
Saitoh T., Kakimoto K., Kato T., Hirayama T., Iijima Y.(ijm@rd.fujikura.co.jp), Sutoh Y., Kaneko N.
Ключевые слова: HTS, YBCO, coated conductors, substrate Hastelloy, IBAD process, template layers, texture, fabrication
Iijima Y., Muroga T., Nagaya S., Kashima N., Saitoh T., Izumi T., Shiohara Y., Watanabe T., Kakimoto K., Yamada Y., Iwai H., Hirayama T., Sutoh Y., Niwa T., Miyata S., Sasaki H., Kato T.(tkato@jfcc.or.jp), Ikuhara Y., Ibi A., Sasaki Y.
Ключевые слова: HTS, YBCO, coated conductors, PLD process, reel-to-reel process, CVD process, multistage process, substrate Hastelloy, grain alignment, microstructure, fabrication
Iijima Y., Takeo M., Kiss T., Saitoh T., Tokunaga Y., Imamura K., Kakimoto K., Inoue M.(inoue@ees.kyushu-u.ac.jp), Matsuda J., Koyanagi S.
Ключевые слова: HTS, YBCO, coated conductors, trapped field, measurement technique, experimental results, magnetic properties
Iijima Y., Takeo M., Kiss T., Saitoh T., Tokunaga Y., Imamura K., Kakimoto K., Inoue M.(inoue@ees.kyushu-u.ac.jp), Tokutomi H., Shoyama T.
Iijima Y., Saitoh T., Watanabe T., Kakimoto K., Yamada Y., Sakai N., Chikumoto N., Tajima S., Kato J.Y.(yoshioka@istec.or.jp)
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y.(ysutoh@fujikura.co.jp), Kaneko N.
Amemiya N., Iijima Y., Saitoh T., Izumi T., Shiohara Y., Kakimoto K., Yamada Y., Nishioka T., Enomoto N., Zhenan J.
Jiang Z., Iijima Y., Saitoh T., Kakimoto K., Amemiya N.(ame@rain.dnj.ynu.ac.jp)
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, PLD process, substrate Hastelloy, ac losses, experimental results, fabrication
Saitoh T., Kakimoto K., Iijima Y.(ijm@rd.fujikura.co.jp), Sutoh Y., Ajimura S.
Saitoh T., Kakimoto K., Iijima Y.(ijm@rd.fujikura.co.jp), Sutoh Y., Ajimura S.
Iijima Y., Saitoh T., Kakimoto K., Ajimura S., Sutoh Y.(ysutoh@fujikura.co.jp)
Iijima Y., Kiss T., Saitoh T., Inoue M., Matsushita T., Kakimoto K., Otabe E.S., Kiuchi M., Fukumoto Y.(fukumoto@aquarius10.cse.kyutech.ac.jp), Sawa H.
Iijima Y., Kakimoto K.(kakimoto@rd.fujikura.co.jp), Saitoh T.
Iijima Y., Kiss T., Saitoh T., Inoue M., Kuga T., Matsushita T., Kakimoto K., Otabe E.S., Yamauchi K.(yamauchi@aquarius10.cse.kyutech.ac.jp), Kiuchi M.
Iijima Y., Awaji S., Watanabe K., Takeo M., Kiss T., Saitoh T., Shiohara Y., Kuga T., Ishimaru M., Matsushita T., Kakimoto K., Inoue M.(inoue@ees.kyushu-u.ac.jp)
Iijima Y., Awaji S., Watanabe K., Takeo M., Saitoh T., Shiohara Y., Kiss T.(kiss@sc.kyushu-u.ac.jp), Inoue M., Kuga T., Ishimaru M., Egashira S., Irie S., Ohta T., Imamura K., Yasunaga M., Matsushita T., Kakimoto K.
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, PLD process, current-voltage characteristics, n-value, fabrication, critical caracteristics, length
Iijima Y., Awaji S., Watanabe K., Takeo M., Kiss T., Saitoh T., Shiohara Y., Inoue M., Kuga T., Ishimaru M., Egashira S., Matsushita T., Kakimoto K.
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